Rapid determination of nanowire electrical properties using a dielectrophoresis-well based system.

Constantinou, Marios; Hoettges, Kai F; Krylyuk, Sergiy; Davydov, Albert; Rigas, Grigorios P; Stolojan, Vlad; Hughes, Michael P; Shkunov, Maxim

Constantinou, Marios; Hoettges, Kai F; Krylyuk, Sergiy; Davydov, Albert; Rigas, Grigorios P; Stolojan, Vlad; Hughes, Michael P; Shkunov, Maxim.

Afiliación

Constantinou M; Department of Electrical and Electronic Engineering, Advanced Technology Institute, University of Surrey, Guildford, Surrey, GU2 7HX, U.K.
Hoettges KF; Centre for Biomedical Engineering, Department of Mechanical Engineering Sciences, University of Surrey, Guildford, Surrey, GU2 7HX, U.K.
Krylyuk S; Theiss Research, La Jolla, California 92037, USA.
Davydov A; Materials Science and Engineering Division, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA.
Rigas GP; Materials Science and Engineering Division, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA.
Stolojan V; Department of Electrical and Electronic Engineering, Advanced Technology Institute, University of Surrey, Guildford, Surrey, GU2 7HX, U.K.
Hughes MP; Department of Electrical and Electronic Engineering, Advanced Technology Institute, University of Surrey, Guildford, Surrey, GU2 7HX, U.K.
Shkunov M; Centre for Biomedical Engineering, Department of Mechanical Engineering Sciences, University of Surrey, Guildford, Surrey, GU2 7HX, U.K.

Appl Phys Lett ; 110(13)2017.

Article en En | MEDLINE | ID: mdl-32999496

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Appl Phys Lett Año: 2017 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Estados Unidos

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