Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging.

Yao, Yudong; Jiang, Yi; Klug, Jeffrey A; Wojcik, Michael; Maxey, Evan R; Sirica, Nicholas S; Roehrig, Christian; Cai, Zhonghou; Vogt, Stefan; Lai, Barry; Deng, Junjing

Yao, Yudong; Jiang, Yi; Klug, Jeffrey A; Wojcik, Michael; Maxey, Evan R; Sirica, Nicholas S; Roehrig, Christian; Cai, Zhonghou; Vogt, Stefan; Lai, Barry; Deng, Junjing.

Afiliación

Yao Y; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Jiang Y; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Klug JA; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Wojcik M; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Maxey ER; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Sirica NS; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Roehrig C; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Cai Z; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Vogt S; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Lai B; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Deng J; Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA. junjingdeng@anl.gov.

Sci Rep ; 10(1): 19550, 2020 Nov 11.

Article en En | MEDLINE | ID: mdl-33177558

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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