An optimized TEM specimen preparation method of quantum nanostructures.

Wang, Hongguang; Srot, Vesna; Fenk, Bernhard; Laskin, Gennadii; Mannhart, Jochen; van Aken, Peter A

Wang, Hongguang; Srot, Vesna; Fenk, Bernhard; Laskin, Gennadii; Mannhart, Jochen; van Aken, Peter A.

Afiliación

Wang H; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany. Electronic address: hgwang@fkf.mpg.de.
Srot V; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany.
Fenk B; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany.
Laskin G; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany.
Mannhart J; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany.
van Aken PA; Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany.

Micron ; 140: 102979, 2021 Jan.

Article en En | MEDLINE | ID: mdl-33197749

Palabras clave

Focused ion beam; Ion milling; NanoMill; Quantum nanostructures; Tripod polishing

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Micron Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2021 Tipo del documento: Article Pais de publicación: Reino Unido

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google