Damage-less observation of polymers by electron dose control in scanning electron microscope.

Hashimoto, Yoichiro; Shigeto, Kunji; Komatsuzaki, Ryo; Saito, Tsutomu; Sekiguchi, Takashi

Hashimoto, Yoichiro; Shigeto, Kunji; Komatsuzaki, Ryo; Saito, Tsutomu; Sekiguchi, Takashi.

Afiliación

Hashimoto Y; Analysis Systems Solution Development Department, Hitachi High-Tech Corporation, 3-2-1 Takatsu, Kanagawa Science Park R&D Business Park Building C-1F, Kawasaki, Kanagawa 213-0012, Japan.
Shigeto K; Graduate School of Science and Technology, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577, Japan.
Komatsuzaki R; Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Saito T; Analysis Systems Software Design Department, Hitachi High-Tech Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Sekiguchi T; Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.

Microscopy (Oxf) ; 70(4): 375-381, 2021 Aug 09.

Article en En | MEDLINE | ID: mdl-33502514

Palabras clave

damage-less observation; dose control; lithium ion battery; polymer; separator; ultra-low voltage scanning electron microscope

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microscopy (Oxf) Año: 2021 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Reino Unido

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