An Adversarial Learning Approach for Super-Resolution Enhancement Based on AgCl@Ag Nanoparticles in Scanning Electron Microscopy Images.

Fan, Li; Wang, Zelin; Lu, Yuxiang; Zhou, Jianguang

Fan, Li; Wang, Zelin; Lu, Yuxiang; Zhou, Jianguang.

Afiliación

Fan L; Research Center for Analytical Instrumentation, State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou 310027, China.
Wang Z; Research Center for Analytical Instrumentation, State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou 310027, China.
Lu Y; Research Center for Analytical Instrumentation, State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou 310027, China.
Zhou J; Research Center for Analytical Instrumentation, State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou 310027, China.

Nanomaterials (Basel) ; 11(12)2021 Dec 06.

Article en En | MEDLINE | ID: mdl-34947654

Palabras clave

AgCl@Ag microstructure; adversarial learning; scanning electron microscopy (SEM); super-resolution

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies / Qualitative_research Idioma: En Revista: Nanomaterials (Basel) Año: 2021 Tipo del documento: Article País de afiliación: China Pais de publicación: Suiza

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