Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy.

Ruppert, Michael G; Martin-Jimenez, Daniel; Yong, Yuen K; Ihle, Alexander; Schirmeisen, André; Fleming, Andrew J; Ebeling, Daniel

Ruppert, Michael G; Martin-Jimenez, Daniel; Yong, Yuen K; Ihle, Alexander; Schirmeisen, André; Fleming, Andrew J; Ebeling, Daniel.

Afiliación

Ruppert MG; School of Engineering, University of Newcastle, Callaghan, NSW, 2308, Australia.
Martin-Jimenez D; Institute of Applied Physics, Justus Liebig University Giessen, Giessen, Germany.
Yong YK; Center for Materials Research, Justus Liebig University Giessen, Giessen, Germany.
Ihle A; School of Engineering, University of Newcastle, Callaghan, NSW, 2308, Australia.
Schirmeisen A; Institute of Applied Physics, Justus Liebig University Giessen, Giessen, Germany.
Fleming AJ; Center for Materials Research, Justus Liebig University Giessen, Giessen, Germany.
Ebeling D; Institute of Applied Physics, Justus Liebig University Giessen, Giessen, Germany.

Nanotechnology ; 33(18)2022 Feb 10.

Article en En | MEDLINE | ID: mdl-34972093

Palabras clave

atomic force microscopy; bond imaging technique; higher eigenmodes; modal analysis; qPlus sensor

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanotechnology Año: 2022 Tipo del documento: Article País de afiliación: Australia Pais de publicación: Reino Unido

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