Your browser doesn't support javascript.
loading
Characterization of the Interfacial Orientation and Molecular Conformation in a Glass-Forming Organic Semiconductor.
Ferron, Thomas J; Thelen, Jacob L; Bagchi, Kushal; Deng, Chuting; Gann, Eliot; de Pablo, Juan J; Ediger, M D; Sunday, Daniel F; DeLongchamp, Dean M.
Afiliación
  • Ferron TJ; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
  • Thelen JL; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
  • Bagchi K; Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States.
  • Deng C; Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.
  • Gann E; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
  • de Pablo JJ; Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.
  • Ediger MD; Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States.
  • Sunday DF; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
  • DeLongchamp DM; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.
ACS Appl Mater Interfaces ; 14(2): 3455-3466, 2022 Jan 19.
Article en En | MEDLINE | ID: mdl-34982543
ABSTRACT
The ability to control structure in molecular glasses has enabled them to play a key role in modern technology; in particular, they are ubiquitous in organic light-emitting diodes. While the interplay between bulk structure and optoelectronic properties has been extensively investigated, few studies have examined molecular orientation near buried interfaces despite its critical role in emergent functionality. Direct, quantitative measurements of buried molecular orientation are inherently challenging, and many methods are insensitive to orientation in amorphous soft matter or lack the necessary spatial resolution. To overcome these challenges, we use polarized resonant soft X-ray reflectivity (p-RSoXR) to measure nanometer-resolved, molecular orientation depth profiles of vapor-deposited thin films of an organic semiconductor Tris(4-carbazoyl-9-ylphenyl)amine (TCTA). Our depth profiling approach characterizes the vertical distribution of molecular orientation and reveals that molecules near the inorganic substrate and free surface have a different, nearly isotropic orientation compared to those of the anisotropic bulk. Comparison of p-RSoXR results with near-edge X-ray absorption fine structure spectroscopy and optical spectroscopies reveals that TCTA molecules away from the interfaces are predominantly planar, which may contribute to their attractive charge transport qualities. Buried interfaces are further investigated in a TCTA bilayer (each layer deposited under separate conditions resulting in different orientations) in which we find a narrow interface between orientationally distinct layers extending across ≈1 nm. Coupling this result with molecular dynamics simulations provides additional insight into the formation of interfacial structure. This study characterizes the local molecular orientation at various types of buried interfaces in vapor-deposited glasses and provides a foundation for future studies to develop critical structure-function relationships.
Palabras clave

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2022 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2022 Tipo del documento: Article País de afiliación: Estados Unidos