Application of UV-Vis Optical Spectroscopy and X-ray Diffraction Methods to Describe the Effect of Alpha-Emitting Radionuclides (Radon) When They Are Detected by Solid-State Film Detectors.

Yerimbetova, Dana; Kozlovskiy, Artem; Stepanenko, Valeriy; Zhumadilov, Kassym

Yerimbetova, Dana; Kozlovskiy, Artem; Stepanenko, Valeriy; Zhumadilov, Kassym.

Afiliación

Yerimbetova D; Engineering Profile Laboratory, L.N. Gumilyov Eurasian National University, Satpayev St., Nur-Sultan 010008, Kazakhstan.
Kozlovskiy A; Engineering Profile Laboratory, L.N. Gumilyov Eurasian National University, Satpayev St., Nur-Sultan 010008, Kazakhstan.
Stepanenko V; Laboratory of Solid State Physics, The Institute of Nuclear Physics, Ibragimov St., Almaty 050032, Kazakhstan.
Zhumadilov K; ASU Innovations, Kh. Dosmukhamedov Atyray University, Studenchesky Ave., Atyrau 060009, Kazakhstan.

Polymers (Basel) ; 14(13)2022 Jul 04.

Article en En | MEDLINE | ID: mdl-35808776

Palabras clave

X-ray diffraction; alpha-particle detection; nitrocellulose detector; optical spectroscopy; radon; solid-state nuclear track detector (SSNTD)

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Polymers (Basel) Año: 2022 Tipo del documento: Article País de afiliación: Kazajstán Pais de publicación: Suiza

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