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Morphological and multifractal properties of Cr thin films deposited onto different substrates.
Zelati, Amir; Mardani, Mohsen; Rezaee, Sahar; Matos, Robert S; Pires, Marcelo A; da Fonseca Filho, Henrique D; Das, Abhijeet; Hafezi, Fatemeh; Rad, Ghasem Amraee; Kumar, Sanjeev; Talu, Stefan.
Afiliación
  • Zelati A; Department of Basic Sciences, Birjand University of Technology, Birjand, Iran.
  • Mardani M; Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran.
  • Rezaee S; Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran.
  • Matos RS; Postgraduate Program in Materials Science and Engineering, Federal University of Sergipe, São Cristovão, Brazil.
  • Pires MA; Department of Physics, Federal University of Ceará-UFC, Fortaleza, Brazil.
  • da Fonseca Filho HD; Laboratory of Synthesis of Nanomaterials and Nanoscopy, Physics Department, Federal University of Amazonas-UFAM, Manaus, Brazil.
  • Das A; Centre for Advanced Research, Department of Physics, Rajiv Gandhi University, Doimukh, India.
  • Hafezi F; Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran.
  • Rad GA; Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran.
  • Kumar S; Centre for Advanced Research, Department of Physics, Rajiv Gandhi University, Doimukh, India.
  • Talu S; The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, Cluj-Napoca, Romania.
Microsc Res Tech ; 86(2): 157-168, 2023 Feb.
Article en En | MEDLINE | ID: mdl-36223516
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Res Tech Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2023 Tipo del documento: Article País de afiliación: Irán Pais de publicación: Estados Unidos
Texto completo
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XML
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Res Tech Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2023 Tipo del documento: Article País de afiliación: Irán Pais de publicación: Estados Unidos