Phase Deflectometry for Defect Detection of High Reflection Objects.

Cheng, Xian-Ming; Wang, Ting-Ting; Zhu, Wen-Bin; Shi, Bai-Di; Chen, Wei

Cheng, Xian-Ming; Wang, Ting-Ting; Zhu, Wen-Bin; Shi, Bai-Di; Chen, Wei.

Afiliación

Cheng XM; College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Wang TT; College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Zhu WB; College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Shi BD; College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Chen W; College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.

Sensors (Basel) ; 23(3)2023 Feb 01.

Article en En | MEDLINE | ID: mdl-36772645

Palabras clave

double surface; phase deflection; surface gradients

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China Pais de publicación: Suiza

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