Prediction of Cognitive Load from Electroencephalography Signals Using Long Short-Term Memory Network.

Yoo, Gilsang; Kim, Hyeoncheol; Hong, Sungdae

Yoo, Gilsang; Kim, Hyeoncheol; Hong, Sungdae.

Afiliación

Yoo G; Creative Informatics and Computing Institute, Korea University, Seoul 02841, Republic of Korea.
Kim H; College of Informatics, Korea University, Seoul 02841, Republic of Korea.
Hong S; Division of Design, Seokyeong University, Seoul 02713, Republic of Korea.

Bioengineering (Basel) ; 10(3)2023 Mar 15.

Article en En | MEDLINE | ID: mdl-36978752

Palabras clave

attention mechanism; cognitive load; deep learning; electroencephalography; long short-term memory network

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies / Risk_factors_studies Idioma: En Revista: Bioengineering (Basel) Año: 2023 Tipo del documento: Article Pais de publicación: Suiza

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google