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Electrophysiological evidence of mal-adaptation to error in remitted depression.
Li, Lilian Y; Glazer, James E; Helgren, Fiona; Funkhouser, Carter J; Auerbach, Randy P; Shankman, Stewart A.
Afiliación
  • Li LY; Department of Psychiatry and Behavioral Sciences, Northwestern University, Chicago, IL, USA. Electronic address: lilian.y.li@northwestern.edu.
  • Glazer JE; Department of Psychiatry and Behavioral Sciences, Northwestern University, Chicago, IL, USA.
  • Helgren F; Department of Psychiatry and Behavioral Sciences, Northwestern University, Chicago, IL, USA.
  • Funkhouser CJ; Department of Psychiatry and Behavioral Sciences, Northwestern University, Chicago, IL, USA; Department of Psychology, University of Illinois at Chicago, Chicago, IL, USA.
  • Auerbach RP; Department of Psychiatry, Columbia University, New York, NY, USA; New York State Psychiatric Institute, New York, NY, USA; Division of Clinical Developmental Neuroscience, Sackler Institute, New York, NY, USA.
  • Shankman SA; Department of Psychiatry and Behavioral Sciences, Northwestern University, Chicago, IL, USA.
Biol Psychol ; 179: 108555, 2023 04.
Article en En | MEDLINE | ID: mdl-37031811
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Trastorno Depresivo Mayor / Electroencefalografía Tipo de estudio: Prognostic_studies Límite: Humans Idioma: En Revista: Biol Psychol Año: 2023 Tipo del documento: Article Pais de publicación: Países Bajos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Trastorno Depresivo Mayor / Electroencefalografía Tipo de estudio: Prognostic_studies Límite: Humans Idioma: En Revista: Biol Psychol Año: 2023 Tipo del documento: Article Pais de publicación: Países Bajos