Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS.

Manard, Benjamin T; Bradley, Veronica C; Quarles, C Derrick; Hendriks, Lyndsey; Dunlap, Daniel R; Hexel, Cole R; Sullivan, Patrick; Andrews, Hunter B

Manard, Benjamin T; Bradley, Veronica C; Quarles, C Derrick; Hendriks, Lyndsey; Dunlap, Daniel R; Hexel, Cole R; Sullivan, Patrick; Andrews, Hunter B.

Afiliación

Manard BT; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Bradley VC; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Quarles CD; Elemental Scientific, Inc., Omaha, NE 68122, USA.
Hendriks L; TOFWERK AG, 3645 Thun, Switzerland.
Dunlap DR; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Hexel CR; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Sullivan P; Elemental Scientific, Inc., Omaha, NE 68122, USA.
Andrews HB; Radioisotope Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

Nanomaterials (Basel) ; 13(8)2023 Apr 09.

Article en En | MEDLINE | ID: mdl-37110906

Palabras clave

ICP-TOF-MS; SP-ICP-MS; automated; high throughput; nanoparticles; single particle

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Suiza

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