A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers.

Haque, Moinul Shahidul; Moniruzzaman, Md; Choi, Seungdeog; Kwak, Sangshin; Okilly, Ahmed H; Baek, Jeihoon

Haque, Moinul Shahidul; Moniruzzaman, Md; Choi, Seungdeog; Kwak, Sangshin; Okilly, Ahmed H; Baek, Jeihoon.

Afiliación

Haque MS; Nexteer Automotive Corp., Saginaw, MI 48601, USA.
Moniruzzaman M; Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA.
Choi S; Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA.
Kwak S; School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea.
Okilly AH; Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea.
Baek J; Electrical Engineering Department, Faculty of Engineering, Assiut University, Assiut 71516, Egypt.

Sensors (Basel) ; 23(9)2023 Apr 29.

Article en En | MEDLINE | ID: mdl-37177599

Palabras clave

SSTS; cascode GAN-FET; degradation aware controller; lifetime estimation; linear quadratic regulator (LQR); switch loss model

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Suiza

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