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Enhanced Transport and Optoelectronic Properties of van der Waals Materials on CaF2 Films.
Song, Haizeng; Zhou, Fei; Yan, Shancheng; Su, Xin; Wu, Han; Wu, Qi; Gao, Yuan; Chen, Rui; Chen, Tianhong; Yao, Jie; Shi, Yi.
Afiliación
  • Song H; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
  • Zhou F; Henan Key Laboratory of Rare Earth Functional Materials, Zhoukou Normal University, Zhoukou 466001, P. R. China.
  • Yan S; State Key Laboratory for Environment-friendly Energy Materials, School of Materials and Chemistry, Southwest University of Science and Technology, Mianyang 621010, P. R. China.
  • Su X; School of Geography and Biological Information, Nanjing University of Posts and Telecommunications, Nanjing 210023, P. R. China.
  • Wu H; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
  • Wu Q; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
  • Gao Y; Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States.
  • Chen R; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
  • Chen T; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
  • Yao J; Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States.
  • Shi Y; School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, P. R. China.
Nano Lett ; 23(11): 4983-4990, 2023 Jun 14.
Article en En | MEDLINE | ID: mdl-37212654

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article Pais de publicación: Estados Unidos