Structural Analysis of Si(OEt)<sub>4</sub> Deposits on Au(111)/SiO<sub>2</sub> Substrates at the Nanometer Scale Using Focused Electron Beam-Induced Deposition.

Mason, Nigel J; Pintea, Maria; Csarnovics, István; Fodor, Tamás; Szikszai, Zita; Kertész, Zsófia

Structural Analysis of Si(OEt)₄ Deposits on Au(111)/SiO₂ Substrates at the Nanometer Scale Using Focused Electron Beam-Induced Deposition.

Mason, Nigel J; Pintea, Maria; Csarnovics, István; Fodor, Tamás; Szikszai, Zita; Kertész, Zsófia.

Afiliación

Mason NJ; School of Physical Sciences, University of Kent, Ingram Building, Room 201, Canterbury CT2 7NZ, United Kingdom.
Pintea M; School of Physical Sciences, University of Kent, Ingram Building, Room 201, Canterbury CT2 7NZ, United Kingdom.
Csarnovics I; Department of Experimental Physics, Institute of Physics, Faculty of Science and Technology, University of Debrecen, Bem sq 18a, Debrecen 4032, Hungary.
Fodor T; Laboratory of Materials Science, Institute for Nuclear Research, Bem tér 18/c, Debrecen 4026, Hungary.
Szikszai Z; Laboratory of Materials Science, Institute for Nuclear Research, Bem tér 18/c, Debrecen 4026, Hungary.
Kertész Z; Laboratory of Materials Science, Institute for Nuclear Research, Bem tér 18/c, Debrecen 4026, Hungary.

ACS Omega ; 8(27): 24233-24246, 2023 Jul 11.

Article en En | MEDLINE | ID: mdl-37457449

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Omega Año: 2023 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Estados Unidos

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