Deep Learning Approach for High-accuracy Electron Counting of Direct Electron Detectors at Increased Electron Dose.

Wei, Jingrui; Moore, Kalani; Bammes, Benjamin; Levin, Barnaby D A; Morgan, Dane; Voyles, Paul M

Wei, Jingrui; Moore, Kalani; Bammes, Benjamin; Levin, Barnaby D A; Morgan, Dane; Voyles, Paul M.

Afiliación

Wei J; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, United States of America.
Moore K; Direct Electron L.P., San Diego, CA, United States of America.
Bammes B; Direct Electron L.P., San Diego, CA, United States of America.
Levin BDA; Direct Electron L.P., San Diego, CA, United States of America.
Voyles PM; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, United States of America.

Microsc Microanal ; 29(Supplement_1): 702-704, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613170

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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