Quantification of Si, Al, Ti and O Composition in Si/Al Oxide Based Synaptic Resistor Circuits.

Xu, Mingjie; Gao, Dawei; Zheng, Jian-Guo; Chen, Yong

Xu, Mingjie; Gao, Dawei; Zheng, Jian-Guo; Chen, Yong.

Afiliación

Xu M; Irvine Materials Research Institute, University of California, Irvine, Irvine, CA, USA.
Gao D; Departments of Mechanical and Aerospace Engineering, Materials Science and Engineering, Electrical and Computer Engineering, California NanoSystems Institute, University of California, Los Angeles, California, USA.
Zheng JG; Irvine Materials Research Institute, University of California, Irvine, Irvine, CA, USA.
Chen Y; Departments of Mechanical and Aerospace Engineering, Materials Science and Engineering, Electrical and Computer Engineering, California NanoSystems Institute, University of California, Los Angeles, California, USA.

Microsc Microanal ; 29(Supplement_1): 240-241, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613430

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos

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