Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix.
Microsc Microanal
; 29(3): 967-982, 2023 Jun 09.
Article
en En
| MEDLINE
| ID: mdl-37749695
ABSTRACT
We present a gradient-descent-based approach to determining the projected electrostatic potential from four-dimensional scanning transmission electron microscopy measurements of a periodic, crystalline material even when dynamical scattering occurs. The method solves for the scattering matrix as an intermediate step, but overcomes the so-called truncation problem that limited previous scattering-matrix-based projected structure determination methods. Gradient descent is made efficient by using analytic expressions for the gradients. Through simulated case studies, we show that iteratively improving the scattering matrix determination can significantly improve the accuracy of the projected structure determination.
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1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Microsc Microanal
Año:
2023
Tipo del documento:
Article
País de afiliación:
Australia