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Band-to-Band Tunneling Leakage Current Characterization and Projection in Carbon Nanotube Transistors.
Lin, Qing; Gilardi, Carlo; Su, Sheng-Kai; Zhang, Zichen; Chen, Edward; Bandaru, Prabhakar; Kummel, Andrew; Radu, Iuliana; Mitra, Subhasish; Pitner, Greg; Wong, H-S Philip.
Afiliación
  • Lin Q; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Gilardi C; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Su SK; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan.
  • Zhang Z; Dept. of Electrical Engineering, University of California San Diego, San Diego, California 92093, United States.
  • Chen E; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan.
  • Bandaru P; Dept. of Electrical Engineering, University of California San Diego, San Diego, California 92093, United States.
  • Kummel A; Dept. of Electrical Engineering, University of California San Diego, San Diego, California 92093, United States.
  • Radu I; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan.
  • Mitra S; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Pitner G; Corporate Research, Taiwan Semiconductor Manufacturing Company, San Jose, California 95134, United States.
  • Wong HP; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
ACS Nano ; 17(21): 21083-21092, 2023 Nov 14.
Article en En | MEDLINE | ID: mdl-37910857
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos