Rapid observation of dispersion curves in system-on-chip devices.

Wei, Zimiao; Chen, Yikai; Li, Junfeng; Wang, Zekai; Wu, Xueqin; Zheng, Jiale; Liu, Xilong; Lan, Wenke; Song, Yang; Shen, Zhonghua; Fu, Qiang

Wei, Zimiao; Chen, Yikai; Li, Junfeng; Wang, Zekai; Wu, Xueqin; Zheng, Jiale; Liu, Xilong; Lan, Wenke; Song, Yang; Shen, Zhonghua; Fu, Qiang.

Afiliación

Wei Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Chen Y; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Li J; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Wang Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Wu X; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Zheng J; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Liu X; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Lan W; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Song Y; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Shen Z; School of Sciences, Nanjing University of Science and Technology, Nanjing 210094, China.
Fu Q; Department of Optoelectronic Information Science and Engineering, School of Physics and Materials Engineering, Hefei Normal University, Hefei 230601, China.

Rev Sci Instrum ; 94(4)2023 Apr 01.

Article en En | MEDLINE | ID: mdl-38081248

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2023 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos

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