Strengthening Multi-Factor Authentication Through Physically Unclonable Functions in PVDF-HFP-Phase-Dependent a-IGZO Thin-Film Transistors.

Han, Youngmin; Lee, Subin; Lee, Eun Kwang; Yoo, Hocheon; Jang, Byung Chul

Han, Youngmin; Lee, Subin; Lee, Eun Kwang; Yoo, Hocheon; Jang, Byung Chul.

Afiliación

Han Y; Department of Electronic Engineering Gachon University, 1342 Seongnam-daero, Seongnam, 13120, South Korea.
Lee S; Department of Electronic Engineering Gachon University, 1342 Seongnam-daero, Seongnam, 13120, South Korea.
Lee EK; Department of Chemical Engineering, Pukyong National University, Busan, 48513, South Korea.
Yoo H; Department of Electronic Engineering Gachon University, 1342 Seongnam-daero, Seongnam, 13120, South Korea.
Jang BC; School of Electronics Engineering, Kyungpook National University, 80 Daehakro, Bukgu, Daegu, 41566, Republic of Korea.

Adv Sci (Weinh) ; 11(18): e2309221, 2024 May.

Article en En | MEDLINE | ID: mdl-38454740

Palabras clave

PVDFHFP; cryptoshredding; decryption; encryption; metal oxide; multifactor authentication; phase transition; physical unclonable function

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Adv Sci (Weinh) Año: 2024 Tipo del documento: Article País de afiliación: Corea del Sur Pais de publicación: Alemania

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