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An experimental and numerical study on adhesion force at the nanoscale.
Kim, Su-Hyun; Choi, Pan-Kyu; Lee, Yong-Bok; Kim, Tae-Soo; Jo, Min-Seung; Lee, So-Young; Min, Hyun-Woo; Yoon, Jun-Bo.
Afiliación
  • Kim SH; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
  • Choi PK; Samsung Electronics Co., Ltd. 1, Samsungjeonja-ro Hwaseong-si Gyeonggi-do 18448 Republic of Korea.
  • Lee YB; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
  • Kim TS; Samsung Electronics Co., Ltd. 1, Samsungjeonja-ro Hwaseong-si Gyeonggi-do 18448 Republic of Korea.
  • Jo MS; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
  • Lee SY; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
  • Min HW; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
  • Yoon JB; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea jbyoon@kaist.ac.kr.
Nanoscale Adv ; 6(8): 2013-2025, 2024 Apr 16.
Article en En | MEDLINE | ID: mdl-38633052
ABSTRACT
Adhesion has attracted great interest in science and engineering especially in the field pertaining to nano-science because every form of physical contact is fundamentally a macroscopic observation of interactions between nano-asperities under the adhesion phenomenon. Despite its importance, no practical adhesion prediction model has been developed due to the complexity of examining contact between nano-asperities. Here, we scrutinized the contact phenomenon and developed a contact model, reflecting the physical sequence in which adhesion develops. For the first time ever, our model analyzes the adhesion force and contact properties, such as separation distance, contact location, actual contact area, and the physical deformation of the asperities, between rough surfaces. Through experiments using atomic force microscopy, we demonstrated a low absolute percentage error of 2.8% and 6.55% between the experimental and derived data for Si-Si and Mo-Mo contacts, respectively, and proved the accuracy and practicality of our model in the analysis of the adhesion phenomenon.

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Adv Año: 2024 Tipo del documento: Article

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Adv Año: 2024 Tipo del documento: Article