Scanning Electron Microscopic Findings of Removed Supramid Extra II(R) from Recurred Congenital Ptosis Patients
Journal of the Korean Ophthalmological Society
; : 363-368, 2002.
Article
en Ko
| WPRIM
| ID: wpr-93617
Biblioteca responsable:
WPRO
ABSTRACT
PURPOSE: To identify the cause of frequent recurrence of ptosis after frontalis suspension with Supramid Extra II(R), we investigated the change occurring in the Supramid following implantation. METHODS: We examined the removed Supramid Extra II(R) from recurred congenital ptosis by scanning electron microscopy. RESULTS: Some cracks were noted on its sheath as well as hydrolytic remnant of internal polyfilament. In most cases, the longer the implantation time was, the more the sign of disintegration was observed. CONCLUSIONS: This study showed that hydrolysis and subsequent weakening of Supramid material might have caused the frequent recurrence of ptosis.
Palabras clave
Texto completo:
1
Base de datos:
WPRIM
Asunto principal:
Recurrencia
/
Microscopía Electrónica de Rastreo
/
Hidrólisis
/
Nylons
Tipo de estudio:
Diagnostic_studies
Límite:
Humans
Idioma:
Ko
Revista:
Journal of the Korean Ophthalmological Society
Año:
2002
Tipo del documento:
Article