Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905).

Marinenko, Ryna B; Turner, Shirley; Simons, David S; Rabb, Savelas A; Zeisler, Rolf L; Yu, Lee L; Newbury, Dale E; Paul, Rick L; Ritchie, Nicholas W M; Leigh, Stefan D; Winchester, Michael R; Richter, Lee J; Meier, Douglas C; Scott, Keana C K; Klinedinst, Donna; Small, John A

Marinenko, Ryna B; Turner, Shirley; Simons, David S; Rabb, Savelas A; Zeisler, Rolf L; Yu, Lee L; Newbury, Dale E; Paul, Rick L; Ritchie, Nicholas W M; Leigh, Stefan D; Winchester, Michael R; Richter, Lee J; Meier, Douglas C; Scott, Keana C K; Klinedinst, Donna; Small, John A.

Affiliation

Marinenko RB; Surface and Microanalysis Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA. ryna.marinenko@nist.gov

Microsc Microanal ; 16(1): 1-12, 2010 Feb.

Article in En | MEDLINE | ID: mdl-20030913

Fulltext

Add to My VHL

XML

PubMed Links

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2010 Document type: Article Affiliation country: Country of publication:

Fulltext

Add to My VHL

XML

PubMed Links

Search on Google