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KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires.
Leclere, C; Cornelius, T W; Ren, Z; Robach, O; Micha, J S; Davydok, A; Ulrich, O; Richter, G; Thomas, O.
Affiliation
  • Leclere C; Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
  • Cornelius TW; Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
  • Ren Z; Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
  • Robach O; CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
  • Micha JS; CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
  • Davydok A; Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
  • Ulrich O; CRG-IF BM32 Beamline at the European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
  • Richter G; Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
  • Thomas O; Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
J Synchrotron Radiat ; 23(Pt 6): 1395-1400, 2016 11 01.
Article in En | MEDLINE | ID: mdl-27787245
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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2016 Document type: Article Affiliation country:
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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2016 Document type: Article Affiliation country: