Your browser doesn't support javascript.
loading
Automatic PCB Sample Generation and Defect Detection Based on ControlNet and Swin Transformer.
Liu, Yulong; Wu, Hao; Xu, Youzhi; Liu, Xiaoming; Yu, Xiujuan.
Affiliation
  • Liu Y; School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.
  • Wu H; School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.
  • Xu Y; School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.
  • Liu X; School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.
  • Yu X; School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.
Sensors (Basel) ; 24(11)2024 May 28.
Article in En | MEDLINE | ID: mdl-38894263
ABSTRACT
In order to improve the efficiency and accuracy of multitarget detection of soldering defects on surface-mounted components in Printed Circuit Board (PCB) fabrication, we propose a sample generation method using Stable Diffusion Model and ControlNet, as well as a defect detection method based on the Swin Transformer. The method consists of two stages First, high-definition original images collected in industrial production and the corresponding prompts are input to Stable Diffusion Model and ControlNet for automatic generation of nonindependent samples. Subsequently, we integrate Swin Transformer as the backbone into the Cascade Mask R-CNN to improve the quality of defect features extracted from the samples for accurate detection box localization and segmentation. Instead of segmenting individual components on the PCB, the method inspects all components in the field of view simultaneously over a larger area. The experimental results demonstrate the effectiveness of our method in scaling up nonindependent sample datasets, thereby enabling the generation of high-quality datasets. The method accurately recognizes targets and detects defect types when performing multitarget inspection on printed circuit boards. The analysis against other models shows that our improved defect detection and segmentation method improves the Average Recall (AR) by 2.8% and the mean Average Precision (mAP) by 1.9%.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sensors (Basel) Year: 2024 Document type: Article Affiliation country:

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Sensors (Basel) Year: 2024 Document type: Article Affiliation country: