X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution.
Phys Rev Lett
; 100(13): 135502, 2008 Apr 04.
Article
de En
| MEDLINE
| ID: mdl-18517965
ABSTRACT
Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.
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Collection:
01-internacional
Base de données:
MEDLINE
Langue:
En
Journal:
Phys Rev Lett
Année:
2008
Type de document:
Article
Pays d'affiliation:
États-Unis d'Amérique