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Nanosphere natural lithography surface texturing as anti-reflective layer on SiC photodiodes.
Zhou, Qiugui; McIntosh, Dion C; Chen, Yaojia; Sun, Wenlu; Li, Zhi; Campbell, Joe C.
Affiliation
  • Zhou Q; Department of Electrical and Computer Engineering, University of Virginia, 351 McCormick Rd, Charlottesville, Virginia 22903, USA.
Opt Express ; 19(24): 23664-70, 2011 Nov 21.
Article de En | MEDLINE | ID: mdl-22109392
ABSTRACT
Natural lithography with 100-nm-diameter SiO(2) spheres followed by inductively coupled plasma etching was used to texture the surface of 4H-SiC for a wide-spectrum large-acceptance-angle anti-reflective layer. The surface showed low normal-incidence reflectance of < 5% over a wide spectrum from 250 nm to 550 nm. Photodiodes fabricated from the surface-textured SiC showed broader spectral and angular responsivity than SiC photodiodes with SiO(2) antireflective coating. The textured SiC photodiodes showed peak responsivity of 116 mA/W, large angle of acceptance angle (< 2% decrease in responsivity at 50° incident angle) and low dark current at 10V.
Sujet(s)

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Sujet principal: Photométrie / Semiconducteurs / Composés du silicium / Composés inorganiques du carbone / Nanotechnologie / Nanosphères Langue: En Journal: Opt Express Sujet du journal: OFTALMOLOGIA Année: 2011 Type de document: Article Pays d'affiliation: États-Unis d'Amérique

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Sujet principal: Photométrie / Semiconducteurs / Composés du silicium / Composés inorganiques du carbone / Nanotechnologie / Nanosphères Langue: En Journal: Opt Express Sujet du journal: OFTALMOLOGIA Année: 2011 Type de document: Article Pays d'affiliation: États-Unis d'Amérique