Thickness variations and absence of lateral compositional fluctuations in aberration-corrected STEM images of InGaN LED active regions at low dose.

Yankovich, Andrew B; Kvit, Alexander V; Li, Xing; Zhang, Fan; Avrutin, Vitaliy; Liu, Huiyong; Izyumskaya, Natalia; Özgür, Ümit; Van Leer, Brandon; Morkoç, Hadis; Voyles, Paul M

Yankovich, Andrew B; Kvit, Alexander V; Li, Xing; Zhang, Fan; Avrutin, Vitaliy; Liu, Huiyong; Izyumskaya, Natalia; Özgür, Ümit; Van Leer, Brandon; Morkoç, Hadis; Voyles, Paul M.

Affiliation

Yankovich AB; 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.
Kvit AV; 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.
Li X; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Zhang F; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Avrutin V; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Liu H; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Izyumskaya N; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Özgür Ü; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Van Leer B; 3FEI Company,Hillsboro,OR 97124,USA.
Morkoç H; 2Department of Electrical and Computer Engineering,Virginia Commonwealth University,Richmond,VA 23284,USA.
Voyles PM; 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.

Microsc Microanal ; 20(3): 864-8, 2014 Jun.

Article de En | MEDLINE | ID: mdl-24667066

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Microsc Microanal Année: 2014 Type de document: Article Pays d'affiliation: États-Unis d'Amérique Pays de publication: Royaume-Uni

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