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Information Technology Measurement and Testing Activities at NIST.
Hogan, M D; Carnahan, L J; Carpenter, R J; Flater, D W; Fowler, J E; Frechette, S P; Gray, M M; Johnson, L A; McCabe, R M; Montgomery, D; Radack, S M; Rosenthal, R; Shakarji, C M.
Affiliation
  • Hogan MD; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Carnahan LJ; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Carpenter RJ; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Flater DW; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Fowler JE; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Frechette SP; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Gray MM; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Johnson LA; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • McCabe RM; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Montgomery D; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Radack SM; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Rosenthal R; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
  • Shakarji CM; National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
J Res Natl Inst Stand Technol ; 106(1): 341-70, 2001.
Article de En | MEDLINE | ID: mdl-27500026

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: J Res Natl Inst Stand Technol Année: 2001 Type de document: Article Pays de publication: États-Unis d'Amérique

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: J Res Natl Inst Stand Technol Année: 2001 Type de document: Article Pays de publication: États-Unis d'Amérique