Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo.

Da, Bo; Liu, Jiangwei; Harada, Yoshitomo; Cuong, Nguyen T; Tsukagoshi, Kazuhito; Hu, Jin; Yang, Lihao; Ding, Zejun; Yoshikawa, Hideki; Tanuma, Shigeo

Da, Bo; Liu, Jiangwei; Harada, Yoshitomo; Cuong, Nguyen T; Tsukagoshi, Kazuhito; Hu, Jin; Yang, Lihao; Ding, Zejun; Yoshikawa, Hideki; Tanuma, Shigeo.

Affiliation

Da B; Research and Services Division of Materials Data and Integrated System , National Institute for Materials Science , 1-1 Namiki , Tsukuba , Ibaraki 305-0044 Japan.
Liu J; Research Center for Advanced Measurement and Characterization , National Institute for Materials Science , 1-2-1 Sengen , Tsukuba , Ibaraki 305-0047 , Japan.
Harada Y; Research Center for Functional Materials , National Institute for Materials Science , 1-2-1 Sengen , Tsukuba , Ibaraki 305-0047 , Japan.
Cuong NT; Research Center for Advanced Measurement and Characterization , National Institute for Materials Science , 1-2-1 Sengen , Tsukuba , Ibaraki 305-0047 , Japan.
Tsukagoshi K; International Center for Young Scientists , National Institute for Materials Science , 1-1 Namiki , Tsukuba , Ibaraki 305-0044 , Japan.
Hu J; International Center for Materials Nanoarchitectonics , National Institute for Materials Science (WPI-MANA) , Tsukuba , Ibaraki 305-0044 , Japan.
Yang L; International Center for Materials Nanoarchitectonics , National Institute for Materials Science (WPI-MANA) , Tsukuba , Ibaraki 305-0044 , Japan.
Ding Z; Department of Physics and Institute for Nanoscience and Engineering , University of Arkansas , Fayetteville , Arkansas 72701 , United States.
Yoshikawa H; Department of Physics , University of Science and Technology of China , Hefei , Auhui 230026 , P.R. China.
Tanuma S; Department of Physics , University of Science and Technology of China , Hefei , Auhui 230026 , P.R. China.

J Phys Chem Lett ; 10(19): 5770-5775, 2019 Oct 03.

Article de En | MEDLINE | ID: mdl-31513403

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: J Phys Chem Lett Année: 2019 Type de document: Article Pays de publication: États-Unis d'Amérique

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