Contemporary x-ray wavelength metrology and traceability.

Hudson, L T; Cline, J P; Henins, A; Mendenhall, M H; Szabo, C I

Hudson, L T; Cline, J P; Henins, A; Mendenhall, M H; Szabo, C I.

Affiliation

Hudson LT; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
Cline JP; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
Henins A; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
Mendenhall MH; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
Szabo CI; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.

Radiat Phys Chem Oxf Engl 1993 ; 1672020 Feb.

Article de En | MEDLINE | ID: mdl-32489233

Mots clés

Reference data; Standards; Traceability; Wavelength metrology; X-ray spectroscopy

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Radiat Phys Chem Oxf Engl 1993 Année: 2020 Type de document: Article Pays d'affiliation: États-Unis d'Amérique

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