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Ni-Cu Nanoparticles-Embedded Ag-Based Reflector for High-Efficiency Light-Emitting Diodes.
Chu, Eun-Kyung; Ha, Kab; Noh, Beom-Rae; Kwon, Young-Ju; Oh, Semi; Im, Jaehyuk; Jang, Junhwan; Cho, Soohaeng; Kim, Kyoung-Kook.
Affiliation
  • Chu EK; Department of Advanced Convergence Technology, and Research Institute of Advanced Convergence Technology, Korea Polytechnic University, Siheung, Gyeonggi-do 15073, Korea.
  • Ha K; Department of Advanced Convergence Technology, and Research Institute of Advanced Convergence Technology, Korea Polytechnic University, Siheung, Gyeonggi-do 15073, Korea.
  • Noh BR; Department of Advanced Convergence Technology, and Research Institute of Advanced Convergence Technology, Korea Polytechnic University, Siheung, Gyeonggi-do 15073, Korea.
  • Kwon YJ; Department of Advanced Convergence Technology, and Research Institute of Advanced Convergence Technology, Korea Polytechnic University, Siheung, Gyeonggi-do 15073, Korea.
  • Oh S; Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109, USA.
  • Im J; Department of Physics, Yonsei University, Wonju, Gangwon-do 26493, Korea.
  • Jang J; Department of Physics, Yonsei University, Wonju, Gangwon-do 26493, Korea.
  • Cho S; Department of Physics, Yonsei University, Wonju, Gangwon-do 26493, Korea.
  • Kim KK; Department of Advanced Convergence Technology, and Research Institute of Advanced Convergence Technology, Korea Polytechnic University, Siheung, Gyeonggi-do 15073, Korea.
J Nanosci Nanotechnol ; 20(11): 6732-6737, 2020 Nov 01.
Article de En | MEDLINE | ID: mdl-32604506
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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: J Nanosci Nanotechnol Année: 2020 Type de document: Article Pays de publication: États-Unis d'Amérique
Texte intégral
Ajouter à My VHL
Imprimer
XML
PubMed Links
Recherche sur Google

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: J Nanosci Nanotechnol Année: 2020 Type de document: Article Pays de publication: États-Unis d'Amérique