Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition.

Zhang, Chenyu; Han, Rungang; Zhang, Anru R; Voyles, Paul M

Zhang, Chenyu; Han, Rungang; Zhang, Anru R; Voyles, Paul M.

Affiliation

Zhang C; Department of Materials Science and Engineering, University of Wisconsin-Madison, United States of America.
Han R; Department of Statistics, University of Wisconsin-Madison, United States of America.
Zhang AR; Department of Statistics, University of Wisconsin-Madison, United States of America.
Voyles PM; Department of Materials Science and Engineering, University of Wisconsin-Madison, United States of America. Electronic address: paul.voyles@wisc.edu.

Ultramicroscopy ; 219: 113123, 2020 Dec.

Article de En | MEDLINE | ID: mdl-33032160

Mots clés

Convergent beam electron diffraction; Image denoising; Low-rank tensor; Scanning transmission electron microscopy

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Ultramicroscopy Année: 2020 Type de document: Article Pays d'affiliation: États-Unis d'Amérique

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