Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique.

So, Hyeongsub; Lee, Ro Woon; Hong, Sung Taek; Kim, Kyou-Hyun

So, Hyeongsub; Lee, Ro Woon; Hong, Sung Taek; Kim, Kyou-Hyun.

Affiliation

So H; Korea-Russia Innovation Center, Korea Institute of Industrial Technology, Incheon, 22004, Republic of Korea.
Lee RW; Department of Materials and Science Engineering, Korea University, Seoul, 02841, Republic of Korea.
Hong ST; Korea-Russia Innovation Center, Korea Institute of Industrial Technology, Incheon, 22004, Republic of Korea.
Kim KH; Korea-Russia Innovation Center, Korea Institute of Industrial Technology, Incheon, 22004, Republic of Korea.

Appl Microsc ; 51(1): 10, 2021 Jul 03.

Article de En | MEDLINE | ID: mdl-34216303

Mots clés

Convergence beam electron diffraction; Symmetry; Transmission electron microscopy

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Type d'étude: Diagnostic_studies Langue: En Journal: Appl Microsc Année: 2021 Type de document: Article

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