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Identification of Autism spectrum disorder based on a novel feature selection method and Variational Autoencoder.
Zhang, Fangyu; Wei, Yanjie; Liu, Jin; Wang, Yanlin; Xi, Wenhui; Pan, Yi.
Affiliation
  • Zhang F; College of Engineering, Southern University of Science and Technology, Shenzhen, 518055, China; Centre for High Performance Computing, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China.
  • Wei Y; Centre for High Performance Computing, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China. Electronic address: yj.wei@siat.ac.cn.
  • Liu J; School of Computer Science and Engineering, Central South University, Changsha, 410083, China.
  • Wang Y; Centre for High Performance Computing, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China.
  • Xi W; Centre for High Performance Computing, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China.
  • Pan Y; Centre for High Performance Computing, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China; College of Computer Science and Control Engineering, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China. Electronic a
Comput Biol Med ; 148: 105854, 2022 09.
Article de En | MEDLINE | ID: mdl-35863246

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Sujet principal: Trouble du spectre autistique Type d'étude: Diagnostic_studies / Screening_studies Limites: Humans Langue: En Journal: Comput Biol Med Année: 2022 Type de document: Article Pays d'affiliation: Chine Pays de publication: États-Unis d'Amérique

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Sujet principal: Trouble du spectre autistique Type d'étude: Diagnostic_studies / Screening_studies Limites: Humans Langue: En Journal: Comput Biol Med Année: 2022 Type de document: Article Pays d'affiliation: Chine Pays de publication: États-Unis d'Amérique