Design of a CMOS Image Sensor with Bi-Directional Gamma-Corrected Digital-Correlated Double Sampling.

Cho, Jaehee; Choo, Hyunseon; Lee, Suhyeon; Yoon, Seungju; Kam, Gyuwon; Kim, Sooyoun

Cho, Jaehee; Choo, Hyunseon; Lee, Suhyeon; Yoon, Seungju; Kam, Gyuwon; Kim, Sooyoun.

Affiliation

Cho J; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.
Choo H; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.
Lee S; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.
Yoon S; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.
Kam G; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.
Kim S; Department of Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea.

Sensors (Basel) ; 23(2)2023 Jan 16.

Article de En | MEDLINE | ID: mdl-36679827

Sujet(s)
Mots clés

CMOS image sensor; dynamic range; gamma correction; log-exponential counter; single-slope analog-to-digital converter

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Sujet principal: Imagerie optique Langue: En Journal: Sensors (Basel) Année: 2023 Type de document: Article Pays de publication: Suisse

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