Your browser doesn't support javascript.
loading
Achieving Record-High Photoelectrochemical Photoresponse Characteristics by Employing Co3O4 Nanoclusters as Hole Charging Layer for Underwater Optical Communication.
Kang, Yang; Wang, Danhao; Gao, Yunzhi; Guo, Siqi; Hu, Kejun; Liu, Boyang; Fang, Shi; Memon, Muhammad Hunain; Liu, Xin; Luo, Yuanmin; Sun, Xiyu; Luo, Dongyang; Chen, Wei; Li, Liuan; Jia, Hongfeng; Hu, Wei; Liu, Zhenghui; Ge, Binghui; Sun, Haiding.
Affiliation
  • Kang Y; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Wang D; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Gao Y; Hefei National Laboratory for Physical Science at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Guo S; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China.
  • Hu K; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China.
  • Liu B; Platform for Characterization and Test, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou, Jiangsu 215123, People's Republic of China.
  • Fang S; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Memon MH; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Liu X; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Luo Y; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Sun X; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Luo D; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Chen W; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Li L; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Jia H; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Hu W; Hefei National Laboratory for Physical Science at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
  • Liu Z; Platform for Characterization and Test, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (CAS), Suzhou, Jiangsu 215123, People's Republic of China.
  • Ge B; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Institutes of Physical Science and Information Technology, Anhui University, Hefei, Anhui 230601, People's Republic of China.
  • Sun H; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.
ACS Nano ; 17(4): 3901-3912, 2023 Feb 28.
Article de En | MEDLINE | ID: mdl-36753692
Mots clés
Texte intégral
Ajouter à My VHL
Imprimer
XML
PubMed Links
Recherche sur Google

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: ACS Nano Année: 2023 Type de document: Article Pays de publication: États-Unis d'Amérique
Texte intégral
Ajouter à My VHL
Imprimer
XML
PubMed Links
Recherche sur Google

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: ACS Nano Année: 2023 Type de document: Article Pays de publication: États-Unis d'Amérique