Criticality and Neuromorphic Sensing in a Single Memristor.

Ma, Zelin; Chen, Wanjun; Cao, Xucheng; Diao, Shanqing; Liu, Zhiyu; Ge, Jun; Pan, Shusheng

Ma, Zelin; Chen, Wanjun; Cao, Xucheng; Diao, Shanqing; Liu, Zhiyu; Ge, Jun; Pan, Shusheng.

Affiliation

Ma Z; Research Center for Advanced Information Materials (CAIM), Huangpu Research & Graduate School of Guangzhou University, Guangzhou 510555, China.
Chen W; Solid State Physics & Material Research Laboratory, School of Physics and Material Science, Guangzhou University, Guangzhou 510006, China.
Cao X; Research Center for Advanced Information Materials (CAIM), Huangpu Research & Graduate School of Guangzhou University, Guangzhou 510555, China.
Diao S; Solid State Physics & Material Research Laboratory, School of Physics and Material Science, Guangzhou University, Guangzhou 510006, China.
Liu Z; Research Center for Advanced Information Materials (CAIM), Huangpu Research & Graduate School of Guangzhou University, Guangzhou 510555, China.
Ge J; Solid State Physics & Material Research Laboratory, School of Physics and Material Science, Guangzhou University, Guangzhou 510006, China.
Pan S; Research Center for Advanced Information Materials (CAIM), Huangpu Research & Graduate School of Guangzhou University, Guangzhou 510555, China.

Nano Lett ; 23(13): 5902-5910, 2023 Jul 12.

Article de En | MEDLINE | ID: mdl-37326403

Mots clés

atomic switching; avalanche criticality; memristor; neuromorphic sensing; percolation

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Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Nano Lett Année: 2023 Type de document: Article Pays d'affiliation: Chine

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