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Transfer-Free Analog and Digital Flexible Memristors Based on Boron Nitride Films.
Wang, Sibo; Liu, Xiuhuan; Yu, Han; Liu, Xiaohang; Zhao, Jihong; Hou, Lixin; Gao, Yanjun; Chen, Zhanguo.
Affiliation
  • Wang S; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
  • Liu X; College of Communication Engineering, Jilin University, Changchun 130012, China.
  • Yu H; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
  • Liu X; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
  • Zhao J; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
  • Hou L; College of Information Technology, Jilin Agricultural University, Changchun 130118, China.
  • Gao Y; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
  • Chen Z; State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China.
Nanomaterials (Basel) ; 14(4)2024 Feb 07.
Article de En | MEDLINE | ID: mdl-38392700
ABSTRACT
The traditional von Neumann architecture of computers, constrained by the inherent separation of processing and memory units, faces challenges, for instance, memory wall issue. Neuromorphic computing and in-memory computing offer promising paradigms to overcome the limitations of additional data movement and to enhance computational efficiency. In this work, transfer-free flexible memristors based on hexagonal boron nitride films were proposed for analog neuromorphic and digital memcomputing. Analog memristors were prepared; they exhibited synaptic behaviors, including paired-pulse facilitation and long-term potentiation/depression. The resistive switching mechanism of the analog memristors were investigated through transmission electron microscopy. Digital memristors were prepared by altering the electrode materials, and they exhibited reliable device performance, including a large on/off ratio (up to 106), reproducible switching endurance (>100 cycles), non-volatile characteristic (>60 min), and effective operating under bending conditions (>100 times).
Mots clés

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Nanomaterials (Basel) Année: 2024 Type de document: Article Pays d'affiliation: Chine Pays de publication: Suisse

Texte intégral: 1 Collection: 01-internacional Base de données: MEDLINE Langue: En Journal: Nanomaterials (Basel) Année: 2024 Type de document: Article Pays d'affiliation: Chine Pays de publication: Suisse