The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry.
Phys Chem Chem Phys
; 18(4): 3316-21, 2016 Jan 28.
Article
in En
| MEDLINE
| ID: mdl-26752103
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1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Phys Chem Chem Phys
Journal subject:
BIOFISICA
/
QUIMICA
Year:
2016
Document type:
Article
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