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Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.
Belsey, Natalie A; Cant, David J H; Minelli, Caterina; Araujo, Joyce R; Bock, Bernd; Brüner, Philipp; Castner, David G; Ceccone, Giacomo; Counsell, Jonathan D P; Dietrich, Paul M; Engelhard, Mark H; Fearn, Sarah; Galhardo, Carlos E; Kalbe, Henryk; Won Kim, Jeong; Lartundo-Rojas, Luis; Luftman, Henry S; Nunney, Tim S; Pseiner, Johannes; Smith, Emily F; Spampinato, Valentina; Sturm, Jacobus M; Thomas, Andrew G; Treacy, Jon P W; Veith, Lothar; Wagstaffe, Michael; Wang, Hai; Wang, Meiling; Wang, Yung-Chen; Werner, Wolfgang; Yang, Li; Shard, Alexander G.
Affiliation
  • Belsey NA; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
  • Cant DJ; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
  • Minelli C; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
  • Araujo JR; Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Divisão de Metrologia de Materiais (Dimat) Avenida Nossa Senhora das Graças, 50 Duque de Caxias, RJ 25250-020, Brazil.
  • Bock B; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany.
  • Brüner P; ION-TOF GmbH, Heisenbergstr. 15, 48149 Münster, Germany.
  • Castner DG; National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA 98195-1653, USA.
  • Ceccone G; European Commission Joint Research Centre, Institute for Health and Consumer Protection, Nanobiosciences Unit, Via E. Fermi 2749, 21027 Ispra, Italy.
  • Counsell JD; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, UK.
  • Dietrich PM; BAM Federal Institute for Materials Research and Testing (BAM 6.1), Unter den Eichen 44-46, D-12203 Berlin, Germany.
  • Engelhard MH; Pacific Northwest National Laboratory, EMSL, Richland, WA 99352, USA.
  • Fearn S; Department of Materials, Imperial College London, South Kensington Campus, London SW7 2AZ, UK.
  • Galhardo CE; Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Divisão de Metrologia de Materiais (Dimat) Avenida Nossa Senhora das Graças, 50 Duque de Caxias, RJ 25250-020, Brazil.
  • Kalbe H; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, UK.
  • Won Kim J; Korea Research Institute of Standards and Science, 267 Gajeong-ro, Daejeon 34113, Korea.
  • Lartundo-Rojas L; Instituto Politécnico Nacional, Centro de Nanociencias y Micro y Nanotecnologías, UPALM, Zacatenco, México D.F. CP. 07738, México.
  • Luftman HS; Surface Analysis Facility, Lehigh University, 7 Asa Drive, Bethlehem, PA 18015. USA.
  • Nunney TS; Thermo Fisher Scientific, Unit 24, The Birches Industrial Estate, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB, UK.
  • Pseiner J; Institut fuer Angewandte Physik, TU Vienna, Wiedner Hauptstr 8-10, A 1040 Vienna, Austria.
  • Smith EF; Nanoscale and Microscale Research Centre, School of Chemistry, University of Nottingham, University Park, Nottingham NG7 2RD, UK.
  • Spampinato V; National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA 98195-1653, USA.
  • Sturm JM; Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, the Netherlands.
  • Thomas AG; School of Materials and Photon Science Institute, University of Manchester, Manchester, M13 9PL, UK.
  • Treacy JP; Thermo Fisher Scientific, Unit 24, The Birches Industrial Estate, Imberhorne Lane, East Grinstead, West Sussex, RH19 1UB, UK.
  • Veith L; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany.
  • Wagstaffe M; School of Materials and Photon Science Institute, University of Manchester, Manchester, M13 9PL, UK.
  • Wang H; National Institute of Metrology, Beijing 100029, P. R. China.
  • Wang M; National Institute of Metrology, Beijing 100029, P. R. China.
  • Wang YC; ION-TOF GmbH, Heisenbergstr. 15, 48149 Münster, Germany.
  • Werner W; Institut fuer Angewandte Physik, TU Vienna, Wiedner Hauptstr 8-10, A 1040 Vienna, Austria.
  • Yang L; Department of Chemistry, Xi'an-Jiaotong Liverpool University, Suzhou, China.
  • Shard AG; National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
J Phys Chem C Nanomater Interfaces ; 120(42): 24070-24079, 2016 Oct 27.
Article in En | MEDLINE | ID: mdl-27818719
We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) inter-laboratory study on the measurement of the shell thickness and chemistry of nanoparticle coatings. Peptide-coated gold particles were supplied to laboratories in two forms: a colloidal suspension in pure water and; particles dried onto a silicon wafer. Participants prepared and analyzed these samples using either X-ray photoelectron spectroscopy (XPS) or low energy ion scattering (LEIS). Careful data analysis revealed some significant sources of discrepancy, particularly for XPS. Degradation during transportation, storage or sample preparation resulted in a variability in thickness of 53 %. The calculation method chosen by XPS participants contributed a variability of 67 %. However, variability of 12 % was achieved for the samples deposited using a single method and by choosing photoelectron peaks that were not adversely affected by instrumental transmission effects. The study identified a need for more consistency in instrumental transmission functions and relative sensitivity factors, since this contributed a variability of 33 %. The results from the LEIS participants were more consistent, with variability of less than 10 % in thickness and this is mostly due to a common method of data analysis. The calculation was performed using a model developed for uniform, flat films and some participants employed a correction factor to account for the sample geometry, which appears warranted based upon a simulation of LEIS data from one of the participants and comparison to the XPS results.

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Phys Chem C Nanomater Interfaces Year: 2016 Document type: Article Country of publication:

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: J Phys Chem C Nanomater Interfaces Year: 2016 Document type: Article Country of publication: