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Towards Automated and High-Throughput Quantitative Sizing and Isotopic Analysis of Nanoparticles via Single Particle-ICP-TOF-MS.
Manard, Benjamin T; Bradley, Veronica C; Quarles, C Derrick; Hendriks, Lyndsey; Dunlap, Daniel R; Hexel, Cole R; Sullivan, Patrick; Andrews, Hunter B.
Affiliation
  • Manard BT; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Bradley VC; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Quarles CD; Elemental Scientific, Inc., Omaha, NE 68122, USA.
  • Hendriks L; TOFWERK AG, 3645 Thun, Switzerland.
  • Dunlap DR; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Hexel CR; Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Sullivan P; Elemental Scientific, Inc., Omaha, NE 68122, USA.
  • Andrews HB; Radioisotope Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Nanomaterials (Basel) ; 13(8)2023 Apr 09.
Article in En | MEDLINE | ID: mdl-37110906
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanomaterials (Basel) Year: 2023 Document type: Article Affiliation country: Country of publication:
Fulltext
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nanomaterials (Basel) Year: 2023 Document type: Article Affiliation country: Country of publication: