Inelastic mean-free path and mean escape depth of 10-140 eV electrons in SiO<sub>2</sub> nanoparticles determined by Si 2p photoelectron yields.

Antonsson, E; Gerke, F; Langer, B; Goroncy, C; Dresch, T; Leisner, T; Graf, C; Rühl, E

Inelastic mean-free path and mean escape depth of 10-140 eV electrons in SiO₂ nanoparticles determined by Si 2p photoelectron yields.

Antonsson, E; Gerke, F; Langer, B; Goroncy, C; Dresch, T; Leisner, T; Graf, C; Rühl, E.

Affiliation

Antonsson E; Physical Chemistry, Freie Universität Berlin, Arnimallee 22, D-14195 Berlin, Germany. ruehl@zedat.fu-berlin.de.
Gerke F; Physical Chemistry, Freie Universität Berlin, Arnimallee 22, D-14195 Berlin, Germany. ruehl@zedat.fu-berlin.de.
Langer B; Physical Chemistry, Freie Universität Berlin, Arnimallee 22, D-14195 Berlin, Germany. ruehl@zedat.fu-berlin.de.
Goroncy C; Physical Chemistry, Freie Universität Berlin, Arnimallee 22, D-14195 Berlin, Germany. ruehl@zedat.fu-berlin.de.
Dresch T; Institute of Meteorology and Climate Research, Karlsruhe Institut of Technology, - KIT Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldhafen, Germany.
Leisner T; Institute of Meteorology and Climate Research, Karlsruhe Institut of Technology, - KIT Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldhafen, Germany.
Graf C; Institute of Environmental Physics, University of Heidelberg, Im Neuenheimer Feld 229, D-69120 Heidelberg, Germany.
Rühl E; Fachbereich Chemie- und Biotechnologie, Hochschule Darmstadt - University of Applied Sciences, Stephanstr. 7, D-64295 Darmstadt, Germany.

Phys Chem Chem Phys ; 25(22): 15173-15182, 2023 Jun 07.

Article in En | MEDLINE | ID: mdl-37222473

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Chem Chem Phys Journal subject: BIOFISICA / QUIMICA Year: 2023 Document type: Article Affiliation country: Country of publication:

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