Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.
Microsc Microanal
; 29(5): 1628-1638, 2023 Sep 29.
Article
in En
| MEDLINE
| ID: mdl-37584510
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1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Microsc Microanal
Year:
2023
Document type:
Article
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