Comparison of methods to evaluate implant-abutment interface
Braz. j. oral sci
; 12(1): 37-40, jan.-mar. 2013. ilus, tab
Artigo
em Inglês
| LILACS, BBO - Odontologia
| ID: lil-671930
Biblioteca responsável:
BR97.1
ABSTRACT
Aim:
To compare two main methods of two-dimensional measurement of fit at the implant prosthodontic interface, testing the hypothesis that optical microscopy (OM) can reliably and efficiently scanning electronic microscopy (SEM).Methods:
Four frameworks with four titanium abutments joined with titanium bars were used. The implant-abutment interfaces were examined by three different methods, forming 3 groups analysis by OM (40x), and analysis by SEM at 300x and 500x. Readings were taken at the mesial and distal proximal surfaces on the horizontal and vertical axes of each implant (n=32). One-way ANOVA with a significance level of 5% was used for statistical analysis.Results:
Neither the horizontal fit nor vertical fit values of the 3 groups presented statistically significant differences (p=0.410 and p=0.543).Conclusions:
OM was found to be an accurate two-dimensional method for abutment-framework or implant-abutment interface measurements, with lower costs than SEM. SEM micrographs at 500x presented technical difficulties for the readings that might produce different results.
Texto completo:
Disponível
Coleções:
Bases de dados internacionais
Base de dados:
BBO - Odontologia
/
LILACS
Assunto principal:
Microscopia Eletrônica de Varredura
/
Implantes Dentários
/
Metodologia como Assunto
Idioma:
Inglês
Revista:
Braz. j. oral sci
Assunto da revista:
Odontologia
Ano de publicação:
2013
Tipo de documento:
Artigo
País de afiliação:
Brasil
Instituição/País de afiliação:
Universidade Federal de Uberlândia/BR
/
Universidade de Campinas/BR
/
Universidade de São Paulo/BR