Referenceless segmentation of flaws in woven fabrics.

ABSTRACT

The automatic segmentation of flaws in woven fabrics is achieved by applying Fourier analysis to the image of the sample under inspection, without considering any reference image. No prior information about the fabric structure or the defect is required. The algorithm is based on the structural feature extraction of the weave repeat from the Fourier transform of the sample image. These features are used to define a set of multiresolution bandpass filters, adapted to the fabric structure, that operate in the Fourier domain. Inverse Fourier transformation, binarization, and merging of the information obtained at different scales lead to the output image that contains flaws segmented from the fabric background. The whole process is fully automatic and can be implemented either optically or electronically. Experimental results are presented and discussed for a variety of fabrics and defects.