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Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films.
Langmuir ; 29(4): 1206-10, 2013 Jan 29.
Artigo em Inglês | MEDLINE | ID: mdl-23244532
Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO(2)/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.





Texto completo: Disponível Coleções: Bases de dados internacionais Base de dados: MEDLINE Idioma: Inglês Revista: Langmuir Assunto da revista: Química Ano de publicação: 2013 Tipo de documento: Artigo País de afiliação: Estados Unidos