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Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime.
Tewari, Sumit; Sabater, Carlos; Kumar, Manohar; Stahl, Stefan; Crama, Bert; van Ruitenbeek, Jan M.
Afiliação
  • Tewari S; Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 Leiden, The Netherlands.
  • Sabater C; Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 Leiden, The Netherlands.
  • Kumar M; Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 Leiden, The Netherlands.
  • Stahl S; Stahl Electronics, Hauptstrasse 15, 67582 Mettenhein, Germany.
  • Crama B; Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 Leiden, The Netherlands.
  • van Ruitenbeek JM; Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, Postbus 9504, 2300 Leiden, The Netherlands.
Rev Sci Instrum ; 88(9): 093903, 2017 Sep.
Artigo em Inglês | MEDLINE | ID: mdl-28964189
ABSTRACT
Shot noise measurements on atomic and molecular junctions provide rich information about the quantum transport properties of the junctions and on the inelastic scattering events taking place in the process. Dissipation at the nanoscale, a problem of central interest in nano-electronics, can be studied in its most explicit and simplified form. Here, we describe a measurement technique that permits extending previous noise measurements to a much higher frequency range, and to much higher bias voltage range, while maintaining a high accuracy in noise and conductance. We also demonstrate the advantages of having access to the spectral information for diagnostics.

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Texto completo: Disponível Coleções: Bases de dados internacionais Base de dados: MEDLINE Idioma: Inglês Revista: Rev Sci Instrum Ano de publicação: 2017 Tipo de documento: Artigo País de afiliação: Holanda